Certification: | RoHS, ISO |
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Encapsulation Structure: | Plastic Sealed Transistor |
Installation: | Plug-in Triode |
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Parameter | Value | Unit |
VDS | 700 | V |
ID, pulse | 38 | A |
RDS(ON) , max @ VGS=10V | 250 | mΩ |
Qg | 39 | nC |
Product Name | Package | Marking |
OSG70R250KSF | TO263 | OSG70R250KS |
Parameter | Symbol | Value | Unit |
Drain-source voltage | VDS | 700 | V |
Gate-source voltage | VGS | ±30 | V |
Continuous drain current1) , TC=25 °C | ID |
17 | A |
Continuous drain current1) , TC=100 °C | 10.8 | ||
Pulsed drain current2) , TC=25 °C | ID, pulse | 38 | A |
Continuous diode forward current1) , TC=25 °C | IS | 17 | A |
Diode pulsed current2) , TC=25 °C | IS, pulse | 38 | A |
Power dissipation3) , TC=25 °C | PD | 163 | W |
Single pulsed avalanche energy5) | EAS | 243 | mJ |
MOSFET dv/dt ruggedness, VDS=0…640 V | dv/dt | 50 | V/ns |
Reverse diode dv/dt, VDS=0…640 V, ISD≤ID | dv/dt | 15 | V/ns |
Operation and storage temperature | Tstg, Tj | -55 to 150 | °C |
Parameter | Symbol | Value | Unit |
Thermal resistance, junction-case | RθJC | 0.77 | °C/W |
Thermal resistance, junction-ambient4) | RθJA | 62 | °C/W |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Drain-source breakdown voltage |
BVDSS | 700 | V | VGS=0 V, ID=250 μA | ||
Gate threshold voltage |
VGS(th) | 2.9 | 3.9 | V | VDS=VGS , ID=250 μA | |
Drain-source on- state resistance | RDS(ON) |
0.17 | 0.25 | Ω |
VGS=10 V, ID=8.5 A | |
0.44 | VGS=10 V, ID=8.5 A, Tj=150 °C | |||||
Gate-source leakage current |
IGSS |
100 | nA |
VGS=30 V | ||
- 100 | VGS=-30 V | |||||
Drain-source leakage current |
IDSS | 1 | μA | VDS=700 V, VGS=0 V | ||
Gate resistance | RG | 9 | Ω | ƒ=1 MHz, Open drain |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Input capacitance | Ciss | 1750 | pF | VGS=0 V, VDS=50 V, ƒ=100 kHz |
||
Output capacitance | Coss | 200 | pF | |||
Reverse transfer capacitance | Crss | 13 | pF | |||
Turn-on delay time | td(on) | 17 | ns | VGS=10 V, VDS=400 V, RG=2 Ω, ID=8 A |
||
Rise time | tr | 14 | ns | |||
Turn-off delay time | td(off) | 64 | ns | |||
Fall time | tf | 11 | ns |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Total gate charge | Qg | 39 | nC | VGS=10 V, VDS=400 V, ID=8 A |
||
Gate-source charge | Qgs | 9 | nC | |||
Gate-drain charge | Qgd | 15 | nC | |||
Gate plateau voltage | Vplateau | 5.3 | V |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Diode forward voltage | VSD | 1.3 | V | IS=17 A, VGS=0 V |
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Reverse recovery time | trr | 294 | ns | VR =400 V, IS=8 A, di/dt=100 A/μs |
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Reverse recovery charge | Qrr | 4 | μC | |||
Peak reverse recovery current | Irrm | 25 | A |