Application: | Refrigerator |
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Batch Number: | 2010+ |
Manufacturing Technology: | Discrete Device |
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General Description
The GreenMOS® high voltage MOSFET utilizes charge balance technology to achieve outstanding low on-resistance and lower gate charge. It is engineered to minimize conduction loss, provide superior switching performance and robust avalanche capability.
The GreenMOS® Generic series is optimized for extreme switching performance to minimize switching loss. It is tailored for high power density applications to meet the highest efficiency standards.
Features
. Low RDS(ON) & FOM
. Extremely low switching loss
. Excellent stability and uniformity
Applications
. PC power
. LED lighting
. Telecom power
. Server power
. EV Charger
. Solar/UPS
Key Performance Parameters
Parameter | Value | Unit |
VDS, min @ Tj(max) | 850 | V |
ID, pulse | 45 | A |
RDS(ON) , max @ VGS=10V | 300 | mΩ |
Qg | 23.3 | nC |
Product Name | Package | Marking |
OSG80R300JF | PDFN 8×8 | OSG80R300J |
Parameter | Symbol | Value | Unit |
Drain-source voltage | VDS | 800 | V |
Gate-source voltage | VGS | ±30 | V |
Continuous drain current1) , TC=25 °C | ID |
15 | A |
Continuous drain current1) , TC=100 °C | 9.5 | ||
Pulsed drain current2) , TC=25 °C | ID, pulse | 45 | A |
Continuous diode forward current1) , TC=25 °C | IS | 15 | A |
Diode pulsed current2) , TC=25 °C | IS, pulse | 45 | A |
Power dissipation3) , TC=25 °C | PD | 151 | W |
Single pulsed avalanche energy5) | EAS | 360 | mJ |
MOSFET dv/dt ruggedness, VDS=0…480 V | dv/dt | 50 | V/ns |
Reverse diode dv/dt, VDS=0…480 V, ISD≤ID | dv/dt | 15 | V/ns |
Operation and storage temperature | Tstg, Tj | -55 to 150 | °C |
Parameter | Symbol | Value | Unit |
Thermal resistance, junction-case | RθJC | 0.83 | °C/W |
Thermal resistance, junction-ambient4) | RθJA | 62 | °C/W |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Drain-source breakdown voltage |
BVDSS |
800 | V |
VGS=0 V, ID=250 μA | ||
850 | VGS=0 V, ID=250 μA, Tj=150 °C | |||||
Gate threshold voltage |
VGS(th) | 2.9 | 3.9 | V | VDS=VGS , ID=250 μA | |
Drain-source on- state resistance | RDS(ON) |
0.24 | 0.3 | Ω |
VGS=10 V, ID=7.5 A | |
0.64 | VGS=10 V, ID=7.5 A, Tj=150 °C | |||||
Gate-source leakage current |
IGSS |
100 | nA |
VGS=30 V | ||
- 100 | VGS=-30 V | |||||
Drain-source leakage current |
IDSS | 5 | μA | VDS=800 V, VGS=0 V | ||
Gate resistance | RG | 18.2 | Ω | ƒ=1 MHz, Open drain |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Input capacitance | Ciss | 1552 | pF | VGS=0 V, VDS=50 V, ƒ=100 kHz |
||
Output capacitance | Coss | 80.1 | pF | |||
Reverse transfer capacitance | Crss | 2.1 | pF | |||
Turn-on delay time | td(on) | 33.6 | ns | VGS=10 V, VDS=400 V, RG=2 Ω, ID=7.5 A |
||
Rise time | tr | 20.3 | ns | |||
Turn-off delay time | td(off) | 57.9 | ns | |||
Fall time | tf | 4.5 | ns |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Total gate charge | Qg | 22.7 | nC | VGS=10 V, VDS=400 V, ID=7.5 A |
||
Gate-source charge | Qgs | 8.6 | nC | |||
Gate-drain charge | Qgd | 2.3 | nC | |||
Gate plateau voltage | Vplateau | 5.5 | V |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Diode forward voltage | VSD | 1.3 | V | IS=15 A, VGS=0 V |
||
Reverse recovery time | trr | 313.7 | ns | VR =400 V, IS=7.5 A, di/dt=100 A/μs |
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Reverse recovery charge | Qrr | 4.2 | μC | |||
Peak reverse recovery current | Irrm | 25.2 | A |
Note
1) Calculated continuous current based on maximum allowable junction temperature. 2) Repetitive rating; pulse width limited by max. junction temperature.
3) Pd is based on max. junction temperature, using junction-case thermal resistance.
4) The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with Ta=25 °C.
5) VDD=100 V, VGS=10 V, L=80 mH, starting Tj=25 °C.
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