Vds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet

Product Details
Batch Number: 2024+
Certification: RoHS
Manufacturing Technology: Discrete Device
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  • Vds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet
  • Vds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet
  • Vds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet
  • Vds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet
  • Vds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet
  • Vds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet
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  • Overview
  • Product Description
Overview

Basic Info.

Model NO.
OSG65R099HSZAF-1
Material
Silicon Wafers
Model
Osg65r099hszaf
Package
To247
Signal Processing
Analog Digital Composite and Function
Description
Extremely Low Switching Loss
Characteristics
Excellent Stability and Uniformity
Applications
PC Power
Industries
LED Lighting
Warranty
24 Months
Transport Package
Air
Specification
OSG65R099HSZAF
Trademark
Orientalsemiconductor
Origin
China
HS Code
854129000
Production Capacity
20kkkk/Monthly

Packaging & Delivery

Package Size
59.00cm * 34.00cm * 15.00cm
Package Gross Weight
19.000kg

Product Description

Product Description

General Description

The GreenMOS® high voltage MOSFET utilizes charge balance technology to achieve outstanding low on-resistance and lower gate charge. It is engineered to minimize conduction loss, provide superior switching performance and robust avalanche capability.
The GreenMOS® Z series is integrated with fast recovery diode (FRD) to minimize reverse recovery time. It is suitable for resonant switching topologies to reach higher efficiency, higher reliability and smaller form factor.

Features                                                                                                   
  • Low RDS(on) & FOM
  • Extremely low switching loss
  • Excellent stability and uniformity
  • Ultra-fast and robust body diode
  • AEC-Q101 Qualified for Automotive Application

Applications
  • PC power
  • Telecom power
  • Server power
  • EV Charger
  • Motor driver

Key Performance Parameters

 
Parameter Value Unit
VDS 650 V
ID, pulse 96 A
RDS(ON), max @ VGS=10V 99
Qg 66.6 nC

Marking Information

 
Product Name Package Marking
OSG65R099HSZAF TO247 OSG65R099HSZA


The HTRB test was performed at 600V more strictly than the AEC-Q101 rev.C (80% V(BR)DSS). All the other tests were performed according to AEC Q101 rev. E.
 
Absolute Maximum Ratings at Tj=25°C unless otherwise noted
 
Parameter Symbol Value Unit
Drain-source voltage VDS 650 V
Gate-source voltage VGS ±30 V
Continuous drain current1), TC=25 °C
ID
32
A
Continuous drain current1), TC=100 °C 20
Pulsed drain current2), TC=25 °C ID, pulse 96 A
Continuous diode forward current1), TC=25 °C IS 32 A
Diode pulsed current2), TC=25 °C IS, pulse 96 A
Power dissipation3) ,TC=25 °C PD 278 W
Single pulsed avalanche energy5) EAS 648 mJ
MOSFET dv/dt ruggedness, VDS=0…480 V dv/dt 50 V/ns
Reverse diode dv/dt, VDS=0…480 V, ISD≤ID dv/dt 50 V/ns
Operation and storage temperature Tstg, Tj -55 to 150 °C

Thermal Characteristics
 
Parameter Symbol Value Unit
Thermal resistance, junction-case RθJC 0.45 °C/W
Thermal resistance, junction-ambient4) RθJA 62 °C/W

Electrical Characteristics at Tj=25°C unless otherwise specified
Parameter Symbol Min. Typ. Max. Unit Test condition
Drain-source breakdown voltage BVDSS 650     V VGS=0 V, ID=1 mA
Gate threshold voltage VGS(th) 3.0   4.5 V VDS=VGS, ID=1 mA

Drain-source on- state resistance

RDS(ON)
  0.090 0.099
Ω
VGS=10 V, ID=16 A
  0.21   VGS=10 V, ID=16 A, Tj=150 °C
Gate-source leakage current
IGSS
    100
nA
VGS=30 V
    -100 VGS=-30 V
Drain-source leakage current IDSS     10 μA VDS=650 V, VGS=0 V
Gate resistance RG   7.8   Ω ƒ=1 MHz, Open drain

Dynamic Characteristics
Parameter Symbol Min. Typ. Max. Unit Test condition
Input capacitance Ciss   3988   pF
VGS=0 V, VDS=50 V,
ƒ=100 kHz
Output capacitance Coss   210   pF
Reverse transfer capacitance Crss   7.4   pF
Effective output capacitance, energy related Co(er)   124   pF
VGS=0 V, VDS=0 V-400 V
Effective output capacitance, time related Co(tr)   585   pF
Turn-on delay time td(on)   46.0   ns
VGS=10 V, VDS=400 V, RG=2 Ω, ID=20 A
Rise time tr   60.3   ns
Turn-off delay time td(off)   93.0   ns
Fall time tf   3.7   ns

Gate Charge Characteristics
Parameter Symbol Min. Typ. Max. Unit Test condition
Total gate charge Qg   66.6   nC

VGS=10 V, VDS=400 V, ID=20 A
Gate-source charge Qgs   20.6   nC
Gate-drain charge Qgd   24.8   nC
Gate plateau voltage Vplateau   6.7   V

Body Diode Characteristics
Parameter Symbol Min. Typ. Max. Unit Test condition
Diode forward voltage VSD     1.3 V IS=32 A, VGS=0 V
Reverse recovery time trr   151.7   ns
IS=20 A,
di/dt=100 A/μs
Reverse recovery charge Qrr   1.0   μC
Peak reverse recovery current Irrm   12.3   A

Note
  1. Calculated continuous current based on maximum allowable junction temperature.
  2. Repetitive rating; pulse width limited by max. junction temperature.
  3. Pd is based on max. junction temperature, using junction-case thermal resistance.
  4. VDD=100 V, VGS=10 V, L=80 mH, starting Tj=25 °C.
 
Vds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet
 
Vds 650V RDS99mΩ Fast Recovery Diode High Voltage MosfetVds 650V RDS99mΩ Fast Recovery Diode High Voltage MosfetVds 650V RDS99mΩ Fast Recovery Diode High Voltage MosfetVds 650V RDS99mΩ Fast Recovery Diode High Voltage MosfetVds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet
 Vds 650V RDS99mΩ Fast Recovery Diode High Voltage MosfetVds 650V RDS99mΩ Fast Recovery Diode High Voltage MosfetVds 650V RDS99mΩ Fast Recovery Diode High Voltage Mosfet
 





 

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