Certification: | RoHS, ISO |
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Shape: | Metal Porcelain Tube |
Shielding Type: | Sharp Cutoff Shielding Tube |
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General Description
FSMOS® MOSFET is based on Oriental Semiconductor's unique device design to achieve low RDS(ON), low gate charge, fast switching and excellent avalanche characteristics. The low Vth series is specially optimized for synchronous rectification systems with low driving voltage.Parameter | Value | Unit |
VDS | 40 | V |
ID, pulse | 600 | A |
RDS(ON) max @ VGS=10V | 1.1 | mΩ |
Qg | 118.4 | nC |
Product Name | Package | Marking |
SFS04R013UGF | PDFN5 x 6 | SFS04R013UG |
Parameter | Symbol | Value | Unit |
Drain source voltage | VDS | 40 | V |
Gate source voltage | VGS | ±20 | V |
Continuous drain current1), TC=25 °C | ID | 200 | A |
Pulsed drain current2), TC=25 °C | ID, pulse | 600 | A |
Continuous diode forward current1), TC=25 °C | IS | 200 | A |
Diode pulsed current2), TC=25 °C | IS, Pulse | 600 | A |
Power dissipation3), TC=25 °C | PD | 178 | W |
Single pulsed avalanche energy5) | EAS | 144 | mJ |
Operation and storage temperature | Tstg,Tj | -55 to 175 | °C |
Parameter | Symbol | Value | Unit |
Thermal resistance, junction-case | RθJC | 0.84 | °C/W |
Thermal resistance, junction-ambient4) | RθJA | 62 | °C/W |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Drain-source breakdown voltage | BVDSS | 40 | V | VGS=0 V, ID=250 μA | ||
Gate threshold voltage | VGS(th) | 1.2 | 2.5 | V | VDS=VGS, ID=250 μA | |
Drain-source on- state resistance | RDS(ON) | 0.9 | 1.1 | mΩ | VGS=10 V, ID=20 A | |
Drain-source on- state resistance | RDS(ON) | 1.5 | 2.0 | mΩ | VGS=6 V, ID=20 A | |
Gate-source leakage current | IGSS |
100 | nA |
VGS=20 V | ||
-100 | VGS=-20 V | |||||
Drain-source leakage current | IDSS | 1 | uA | VDS=40 V, VGS=0 V | ||
Gate resistance | RG | 3.2 | Ω | ƒ=1 MHz, Open drain |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Input capacitance | Ciss | 5453 | pF | VGS=0 V, VDS=25 V, ƒ=100 kHz |
||
Output capacitance | Coss | 1951 | pF | |||
Reverse transfer capacitance | Crss | 113 | pF | |||
Turn-on delay time | td(on) | 23.9 | ns | VGS=10 V, VDS=40 V, RG=2 Ω, ID=40 A |
||
Rise time | tr | 16.9 | ns | |||
Turn-off delay time | td(off) | 80.4 | ns | |||
Fall time | tf | 97.7 | ns |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Total gate charge | Qg | 85.6 | nC | VGS=10 V VDS=40 V, ID=40 A, |
||
Gate-source charge | Qgs | 17.6 | nC | |||
Gate-drain charge | Qgd | 14.5 | nC | |||
Gate plateau voltage | Vplateau | 3.6 | V |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Diode forward voltage | VSD | 1.3 | V | IS=20 A, VGS=0 V | ||
Reverse recovery time | trr | 71.1 | ns | VR=40 V, IS=40 A, di/dt=100 A/μs |
||
Reverse recovery charge | Qrr | 50.1 | nC | |||
Peak reverse recovery current | Irrm | 1.2 | A |