Application: | Temperature Measurement |
---|---|
Batch Number: | 2010+ |
Manufacturing Technology: | Optoelectronic Semiconductor |
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Parameter | Value | Unit |
VDS, min @ Tj(max) | 700 | V |
ID, pulse | 240 | A |
RDS(ON) , max @ VGS=10V | 35 | mΩ |
Qg | 153.6 | nC |
Product Name | Package | Marking |
OSG65R035HTF | TO247 | OSG65R035HT |
Parameter | Symbol | Value | Unit |
Drain-source voltage | VDS | 650 | V |
Gate-source voltage | VGS | ±30 | V |
Continuous drain current1), TC=25 °C | ID |
80 | A |
Continuous drain current1), TC=100 °C | 50 | ||
Pulsed drain current2), TC=25 °C | ID, pulse | 240 | A |
Continuous diode forward current1), TC=25 °C | IS | 80 | A |
Diode pulsed current2), TC=25 °C | IS, pulse | 240 | A |
Power dissipation3) TC=25 °C | PD | 455 | W |
Single pulsed avalanche energy5) | EAS | 1700 | mJ |
MOSFET dv/dt ruggedness, VDS=0…480 V | dv/dt | 50 | V/ns |
Reverse diode dv/dt, VDS=0…480 V, ISD≤ID | dv/dt | 15 | V/ns |
Operation and storage temperature | Tstg, Tj | -55 to 150 | °C |
Parameter | Symbol | Value | Unit |
Thermal resistance, junction-case | RθJC | 0.27 | °C/W |
Thermal resistance, junction-ambient4) | RθJA | 62 | °C/W |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Drain-source breakdown voltage |
BVDSS |
650 | V |
VGS=0 V, ID=2 mA | ||
700 | VGS=0 V, ID=2 mA, Tj=150 °C | |||||
Gate threshold voltage | VGS(th) | 2.8 | 4.0 | V | VDS=VGS, ID=2 mA | |
Drain-source on- state resistance |
RDS(ON) |
0.028 | 0.035 | Ω |
VGS=10 V, ID=40 A | |
0.075 | VGS=10 V, ID=40 A, Tj=150 °C | |||||
Gate-source leakage current | IGSS |
100 | nA |
VGS=30 V | ||
-100 | VGS=-30 V | |||||
Drain-source leakage current | IDSS | 5 | μA | VDS=650 V, VGS=0 V | ||
Gate resistance | RG | 2.4 | Ω | ƒ= 1 MHz, Open drain |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Input capacitance | Ciss | 7549.2 | pF | VGS=0 V, VDS=50 V, ƒ=100 kHz |
||
Output capacitance | Coss | 447.1 | pF | |||
Reverse transfer capacitance | Crss | 13.2 | pF | |||
Turn-on delay time | td(on) | 52.3 | ns | VGS=10 V, VDS=400 V, RG=5 Ω, ID=40 A |
||
Rise time | tr | 86.8 | ns | |||
Turn-off delay time | td(off) | 165.2 | ns | |||
Fall time | tf | 8.5 | ns |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Total gate charge | Qg | 153.6 | nC | VGS=10 V, VDS=400 V, ID=40 A |
||
Gate-source charge | Qgs | 41.8 | nC | |||
Gate-drain charge | Qgd | 50.2 | nC | |||
Gate plateau voltage | Vplateau | 5.8 | V |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Diode forward voltage | VSD | 1.3 | V | IS=80 A, VGS=0 V | ||
Reverse recovery time | trr | 566.1 | ns | VR=400V, IS=40 A, di/dt=100 A/μs |
||
Reverse recovery charge | Qrr | 13.2 | μC | |||
Peak reverse recovery current | Irrm | 45.9 | A |