Certification: | RoHS, ISO |
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Shape: | ST |
Shielding Type: | Sharp Cutoff Shielding Tube |
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Parameter | Value | Unit |
VCES, min @ 25°C | 650 | V |
Maximum junction temperature | 175 | °C |
IC, pulse | 300 | A |
VCE(sat), typ @ VGE=15V | 1.45 | V |
Qg | 235 | nC |
Parameter | Symbol | Value | Unit |
Collector emitter voltage | VCES | 650 | V |
Gate emitter voltage | VGES |
±20 | V |
Transient gate emitter voltage, TP≤10µs, D<0.01 | ±30 | V | |
Continuous collector current1) , TC=25ºC | IC |
90 | A |
Continuous collector current1) , TC=100ºC | 75 | A | |
Pulsed collector current2) , TC=25ºC | IC, pulse | 300 | A |
Diode forward current1) , TC=25ºC | IF |
90 | A |
Diode forward current1) , TC=100ºC | 75 | A | |
Diode pulsed current2) , TC=25ºC | IF, pulse | 300 | A |
Power dissipation3) , TC=25ºC | PD |
395 | W |
Power dissipation3) , TC=100ºC | 198 | W | |
Operation and storage temperature | Tstg, Tvj | -55 to 175 | °C |
Parameter | Symbol | Value | Unit |
IGBT thermal resistance, junction-case | RθJC | 0.38 | °C/W |
Diode thermal resistance, junction-case | RθJC | 0.45 | °C/W |
Thermal resistance, junction-ambient | RθJA | 40 | °C/W |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Collector-emitter breakdown voltage | V(BR)CES | 650 | V | VGE =0 V, IC =0.5 mA | ||
Collector-emitter saturation voltage |
VCE(sat) |
1.45 | 1.70 | V | VGE =15 V, IC=75 A Tvj=25°C |
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1.62 | V | VGE =15 V, IC=75 A, Tvj =125°C |
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1.76 | VGE =15 V, IC=75 A, Tvj =175°C |
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Gate-emitter threshold voltage | VGE(th) | 3.5 | 4.5 | 5.5 | V | VCE =VGE , ID =0.5 mA |
Diode forward voltage |
VF |
1.15 | 1.35 | V | VGE =0 V, IF =75 A Tvj =25°C |
|
1.10 | VGE =0 V, IF =75 A, Tvj =125°C |
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1.10 | VGE =0 V, IF =75 A, Tvj =175°C |
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Gate-emitter leakage current |
IGES | 100 | nA | VCE =0 V, VGE=20 V | ||
Zero gate voltage collector current | ICES | 10 | μA | VCE =650 V, VGE =0 V |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Input capacitance | Cies | 7685 | pF | VGE=0 V, VCE =25 V, ƒ=100 kHz |
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Output capacitance | Coes | 1590 | pF | |||
Reverse transfer capacitance | Cres | 61 | pF | |||
Turn-on delay time | td(on) | 80 | ns | VGE=15 V, VCC=400 V, RG=10 Ω, IC=75 A |
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Rise time | tr | 88 | ns | |||
Turn-off delay time | td(off) | 189 | ns | |||
Fall time | tf | 48 | ns | |||
Turn-on energy | Eon | 9.56 | mJ | |||
Turn-off energy | Eoff | 1.21 | mJ | |||
Turn-on delay time | td(on) | 72 | ns | VGE=15 V, VCC=400 V, RG=10 Ω, IC=30 A |
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Rise time | tr | 43 | ns | |||
Turn-off delay time | td(off) | 216 | ns | |||
Fall time | tf | 10 | ns | |||
Turn-on energy | Eon | 3.85 | mJ | |||
Turn-off energy | Eoff | 0.34 | mJ |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Total gate charge | Qg | 235 | nC | VGE =15 V, VCC=520 V, IC=75 A |
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Gate-emitter charge | Qge | 66 | nC | |||
Gate-collector charge | Qgc | 78 | nC |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Diode reverse recovery time | trr | 260 | ns | VR =400 V, IF=75 A, diF/dt=500 A/μs Tvj = 25°C |
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Diode reverse recovery charge | Qrr | 13 | μC | |||
Diode peak reverse recovery current | Irrm | 90 | A |