Certification: | RoHS, ISO |
---|---|
Shape: | ST |
Shielding Type: | Sharp Cutoff Shielding Tube |
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Parameter | Value | Unit |
VDS, min @ Tj(max) | 600 | V |
ID, pulse | 69 | A |
RDS(ON), max @ VGS =10V | 160 | mΩ |
Qg | 21.3 | nC |
Parameter | Symbol | Value | Unit |
Drain-source voltage | VDS | 550 | V |
Gate-source voltage | VGS | ±30 | V |
Continuous drain current1) , TC=25 °C | ID |
23 | A |
Continuous drain current1) , TC=100 °C | 14.5 | ||
Pulsed drain current2) , TC=25 °C | ID, pulse | 69 | A |
Continuous diode forward current1) , TC=25 °C | IS | 23 | A |
Diode pulsed current2) , TC=25 °C | IS, pulse | 69 | A |
Power dissipation3) , TC=25 °C | PD | 34 | W |
Single pulsed avalanche energy5) | EAS | 250 | mJ |
MOSFET dv/dt ruggedness, VDS =0…480 V | dv/dt | 50 | V/ns |
Reverse diode dv/dt, VDS =0…480 V, ISD≤ID | dv/dt | 50 | V/ns |
Operation and storage temperature | Tstg , Tj | -55 to 150 | °C |
Parameter | Symbol | Value | Unit |
Thermal resistance, junction-case | RθJC | 3.7 | °C/W |
Thermal resistance, junction-ambient4) | RθJA | 62.5 | °C/W |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Drain-source breakdown voltage | BVDSS |
550 | V |
VGS =0 V, ID =250 uA | ||
600 | 675 | VGS =0 V, ID =250 uA, Tj =150 °C | ||||
Gate threshold voltage |
VGS(th) | 3.0 | 4.5 | V | VDS =VGS , ID =250 uA, | |
Drain-source on- state resistance | RDS(ON) |
0.12 | 0.16 | Ω |
VGS =10 V, ID=11.5 A | |
0.29 | VGS =10 V, ID=11.5 A, Tj =150 °C | |||||
Gate-source leakage current |
IGSS |
100 | nA |
VGS =30 V | ||
- 100 | VGS =-30 V | |||||
Drain-source leakage current |
IDSS | 10 | μA | VDS =550 V, VGS =0 V |