Certification: | RoHS, ISO |
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Encapsulation Structure: | Chip Transistor |
Installation: | Plug-in Triode |
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General Description
Parameter | Value | Unit |
VCES, min @ 25°C | 650 | V |
Maximum junction temperature | 175 | °C |
IC, pulse | 120 | A |
VCE(sat), typ @ VGE=15V | 1.5 | V |
Qg | 54 | nC |
Product Name | Package | Marking |
OST30N65FMF | TO220F | OST30N65FM |
Parameter | Symbol | Value | Unit |
Collector emitter voltage | VCES | 650 | V |
Gate emitter voltage | VGES |
±20 | V |
Transient gate emitter voltage, TP≤10µs, D<0.01 | ±30 | V | |
Continuous collector current1) , TC=25ºC | IC |
42 | A |
Continuous collector current1) , TC=100ºC | 30 | A | |
Pulsed collector current2) , TC=25ºC | IC, pulse | 120 | A |
Diode forward current1) , TC=25ºC | IF |
42 | A |
Diode forward current1) , TC=100ºC | 30 | A | |
Diode pulsed current2) , TC=25ºC | IF, pulse | 120 | A |
Power dissipation3) , TC=25ºC | PD |
188 | W |
Power dissipation3) , TC=100ºC | 94 | W | |
Operation and storage temperature | Tstg, Tvj | -55 to 175 | °C |
Short circuit withstand time VGE=15 V, VCC≤400 V Allowed number of short circuits<1000 Time between short circuits:≥1.0 S |
tSC |
5 |
μs |
Parameter | Symbol | Value | Unit |
IGBT thermal resistance, junction-case | RθJC | 0.8 | °C/W |
Diode thermal resistance, junction-case | RθJC | 1.65 | °C/W |
Thermal resistance, junction-ambient | RθJA | 65 | °C/W |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Collector-emitter breakdown voltage |
V(BR)CES | 650 | V | VGE=0 V, IC=0.5 mA | ||
Collector-emitter saturation voltage |
VCE(sat) |
1.5 | 1.63 | V | VGE=15 V, IC=30 A Tvj=25°C |
|
1.7 | V | VGE=15 V, IC=30 A, Tvj =125°C |
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1.8 | VGE=15 V, IC=30 A, Tvj =175°C |
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Gate-emitter threshold voltage |
VGE(th) | 4.5 | 5.5 | V | VCE=VGE , ID=0.5 mA | |
Diode forward voltage |
VF |
1.75 | 1.9 | V | VGE=0 V, IF=30 A Tvj =25°C |
|
1.64 | VGE=0 V, IF=30 A, Tvj =125°C |
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1.57 | VGE=0 V, IF=30 A, Tvj =175°C |
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Gate-emitter leakage current |
IGES | 100 | nA | VCE=0 V, VGE=20 V | ||
Zero gate voltage collector current | ICES | 10 | μA | VCE=650 V, VGE=0 V |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Input capacitance | Cies | 3114 | pF | VGE=0 V, VCE=25 V, ƒ=100 kHz |
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Output capacitance | Coes | 65 | pF | |||
Reverse transfer capacitance | Cres | 2.1 | pF | |||
Turn-on delay time | td(on) | 25 | ns | VGE=15 V, VCC=400 V, RG=10 Ω, IC=30 A |
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Rise time | tr | 31 | ns | |||
Turn-off delay time | td(off) | 85 | ns | |||
Fall time | tf | 77 | ns | |||
Turn-on energy | Eon | 0.84 | mJ | |||
Turn-off energy | Eoff | 0.61 | mJ | |||
Turn-on delay time | td(on) | 23 | ns | VGE=15 V, VCC=400 V, RG=10 Ω, IC=15 A |
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Rise time | tr | 13 | ns | |||
Turn-off delay time | td(off) | 119 | ns | |||
Fall time | tf | 52 | ns | |||
Turn-on energy | Eon | 0.38 | mJ | |||
Turn-off energy | Eoff | 0.34 | mJ |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Total gate charge | Qg | 54 | nC | VGE=15 V, VCC=520 V, IC=30 A |
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Gate-emitter charge | Qge | 26 | nC | |||
Gate-collector charge | Qgc | 10 | nC |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Diode reverse recovery time | trr | 91 | ns | VR =400 V, IF=30 A, diF/dt=500 A/μs Tvj = 25°C |
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Diode reverse recovery charge | Qrr | 678 | nC | |||
Diode peak reverse recovery current | Irrm | 14.5 | A |