Certification: | RoHS, ISO |
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Shape: | Metal Porcelain Tube |
Shielding Type: | Sharp Cutoff Shielding Tube |
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General Description
oriental semi FSMOS® MOSFET is based on Oriental Semiconductor's unique device design to achieve low RDS(ON) , low gate charge, fast switching and excellent avalanche characteristics. The high Vth series is specially designed to use in motor control systems with driving voltage of more than 10V .Parameter | Value | Unit |
VDS | 80 | V |
ID, pulse | 800 | A |
RDS(ON), max @ VGS =10V | 1.9 | mΩ |
Qg | 144 | nC |
Parameter | Symbol | Value | Unit |
Drain-source voltage | VDS | 80 | V |
Gate-source voltage | VGS | ±20 | V |
Continuous drain current1) , TC=25 °C | ID | 350 | A |
Pulsed drain current2) , TC=25 °C | ID, pulse | 800 | A |
Continuous diode forward current1) , TC=25 °C | IS | 350 | A |
Diode pulsed current2) , TC=25 °C | IS, pulse | 800 | A |
Power dissipation3), TC=25 °C | PD | 450 | W |
Single pulsed avalanche energy4) | EAS | 735 | mJ |
Operation and storage temperature | Tstg , Tj | -55 to 175 | °C |
Parameter | Symbol | Value | Unit |
Thermal resistance, junction-case | RθJC | 0.33 | °C/W |
Thermal resistance, junction-ambient | RθJA | 62 | °C/W |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Drain-source breakdown voltage | BVDSS | 80 | V | VGS =0 V, ID =250 μA | ||
Gate threshold voltage |
VGS(th) | 2 | 4 | V | VDS =VGS , ID =250 μA | |
Drain-source on-state resistance |
RDS(ON) | 1.5 | 1.9 | mΩ | VGS =10 V, ID=30 A | |
Gate-source leakage current |
IGSS |
100 | nA |
VGS =20 V | ||
- 100 | VGS =-20 V | |||||
Drain-source leakage current |
IDSS | 1 | μA | VDS =80 V, VGS =0 V | ||
Gate resistance | RG | 1.2 | Ω | ƒ=1 MHz, Open drain |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Input capacitance | Ciss | 11200 | pF | VGS =0 V, VDS =25 V, ƒ=100 kHz |
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Output capacitance | Coss | 4880 | pF | |||
Reverse transfer capacitance | Crss | 221 | pF | |||
Turn-on delay time | td(on) | 31 | ns | VGS =10 V, VDS =50 V, RG=2 Ω, ID=25 A |
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Rise time | tr | 26 | ns | |||
Turn-off delay time | td(off) | 75 | ns | |||
Fall time | tf | 28 | ns |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Total gate charge | Qg | 144 | nC | VGS =10 V, VDS =50 V, ID=25 A |
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Gate-source charge | Qgs | 40 | nC | |||
Gate-drain charge | Qgd | 22 | nC | |||
Gate plateau voltage | Vplateau | 3.8 | V |
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Diode forward voltage | VSD | 1.3 | V | IS=30 A, VGS =0 V |
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Reverse recovery time | trr | 123 | ns | VR=50 V, IS=25 A, di/dt=100 A/μs |
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Reverse recovery charge | Qrr | 223 | nC | |||
Peak reverse recovery current | Irrm | 3.2 | A |